Dual-beam electron-ion microscopy

Dual-beam electron-ion microscopy

  • High resolution and contrast images acquisition
  • Elemental analysis of high resolution and sensitivity
  • Electron diffraction and diffraction patterns analysis
  • Analysis of semiconductor device failures
  • Objects and structures modification
  • Preparation of samples for transmission microscopy
  • Electrical measurements in vacuum
  • Single nanoobjects operations
  • Dielectric research