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• Research and development
• Analytical research
• Transmission electron microscopy
• Dual-beam electron-ion microscopy
• Auger Electron Microscopy
• Vacuum probe measurements
• IR and photospectrometry
• Atomic force microscopy

IR and photospectrometry

• Research of the spectral characteristics of radiation sources, photodetectors and optically sensitive materials
• Research of the spectral characteristics of IR-sensitive structures with nano-objects
• Research of the energy characteristics of IR-sensitive sensors with nano-objects