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• Research and development
• Analytical research
• Transmission electron microscopy
• Dual-beam electron-ion microscopy
• Auger Electron Microscopy
• Vacuum probe measurements
• IR and photospectrometry
• Atomic force microscopy

Auger Electron Microscopy

• Secondary electron mapping
• High lateral resolution mapping
• Qualitative and quantitative analysis of the surface of solids
• Non-destructive control of thin films thickness
• Profiling the distribution of atoms by depth