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• Research and development
• Analytical research
• Transmission electron microscopy
• Dual-beam electron-ion microscopy
• Auger Electron Microscopy
• Vacuum probe measurements
• IR and photospectrometry
• Atomic force microscopy

Atomic force microscopy

• Research of surface morphology in semi-contact and soft semi-contact modes

• Research of surface morphology in contact mode
• Lithography with electric current
• Research of the electrophysical parameters of substances and their surfaces
• Research of the capacitive characteristics of substances and their surfaces
• Research of the magnetic properties of substances and their surfaces